Model (Manufacturer) | Spectral range (nm) | Rise time/time resolution (ns) | Comment |
---|---|---|---|
R955 (Hamamatsu) | 160–900 |
Subnanoseconds |
PMT detector |
iSTAR A-DH720-18F-03 (Andor) | 180–850 |
<5 | ICCD detector |
PDA10A (Thorlabs) | 200–1100 |
2.3 | Silicon-amplified photodiode |
APD430A2/M (Thorlabs) | 200–1000 |
<0.88 | UV-enhanced, silicon avalanche photodiode |
PDA10CF (Thorlabs) | 800–1700 | 2.3 | InGaAs-amplified photodiode |
ID | Spectral range (nm) | Blaze (nm) | Lines (g/mm) | Resolution per slit size (nm/mm) | Comment |
---|---|---|---|---|---|
1 | 260–900 | 500 | 300 | 30 | Intended for use with the ICCD detector; cutoff filters are required depending on the measurement range |
2 | 250–525 | 350 | 1200 | 15 | Dedicated for the PMT detector; recommended for wavelengths <525 nm; a BK-7 cutoff filter is required for wavelengths >415 nm |
3 | 520–1200 | 750 | 1200 | 15 | Dedicated for the PMT detector; recommended for wavelengths >525 nm; RG-5 filter is required for wavelengths >685 nm |
ID | Range of application (nm) | Blaze (nm) | Lines (g/mm) | Resolution per slit size (nm/mm) | Comment |
---|---|---|---|---|---|
1 | 200–310 | 250 | 1800 | 30 | – |
2 | 310–570 | 500 | 1200 | 10 | BK-7 cutoff filter (or its equivalent) should be used at wavelengths >415 nm |
3 | 550–1200 | 1000 | 600 | 20 | RG-5 filter (or its equivalent) should be used at wavelengths >685 nm |
Type of trace | Incident beam | Monitoring light shutter | Description |
---|---|---|---|
SGN(t) | ON | ON | This trace carries the main information about the chemical/physical changes of the irradiated sample. |
LIGHT(t) | OFF | ON | Trace carries information about the shape of the monitoring light. It is optionally used to correct the resulting output for time-dependent monitoring of light fluctuations. |
PULSE(t) | ON | OFF | Response of the detection system on the incident beam pulse. Important for elimination of emission of sample from absorption output data. |
NOISE(t) | OFF | OFF | Response of detection system on electromagnetic noise generated due to triggering of high-energy incident pulse. In general, it is used for diagnostic purpose or automatic measurement of optical detector offset current. In some cases, it can be used to eliminate electromagnetic, reproducible noise from the detector output (if it is not possible to eliminate noise by hardware handling). |