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An FPGA Architecture for Extracting Real-Time Zernike Coefficients from Measured Phase Gradients

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Steven Moser
Embedded Systems Group, University of Kent, Canterbury, United Kingdom
Peter Lee
Embedded Systems Group, University of Kent, Canterbury, United Kingdom
Adrian Podoleanu
Applied Optics Group, University of Kent, Canterbury, United Kingdom
eISSN:
1335-8871
Langue:
Anglais
Périodicité:
6 fois par an
Sujets de la revue:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing