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An FPGA Architecture for Extracting Real-Time Zernike Coefficients from Measured Phase Gradients


Cite

Steven Moser
Embedded Systems Group, University of Kent, Canterbury, United Kingdom
Peter Lee
Embedded Systems Group, University of Kent, Canterbury, United Kingdom
Adrian Podoleanu
Applied Optics Group, University of Kent, Canterbury, United Kingdom
eISSN:
1335-8871
Idioma:
Inglés
Calendario de la edición:
6 veces al año
Temas de la revista:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing