<abstract xmlns="http://www.w3.org/1999/xhtml"><p>The resonant type power supplies of medium frequency designed for magnetron sputtering processes often use pulse density modulation to regulate the average discharge power level. While the output power level changes then number of pulses in a group changes, but the discharge current pulses are the same from pulse to pulse: their parameters (duration time, amplitude) do not change with the discharge power. The goal of this paper is to present the influence of medium frequency discharge power level on the direct current I-V characteristics of a single Langmuir probe and resulting plasma parameters caused by the pulse density modulation. The sputtering processes of titanium and copper were diagnosed at two spatial positions. The measured Langmuir probe I-V characteristics showed strong dependence on the discharge power. As the discharge powering pulses stay the same with the discharge power level change, such influence was unlikely to occur. Using time-resolved analysis of probe current waveforms the origin of this influence was indicated. The influence of discharge power level on the single probe Langmuir I-V characteristics and resulting plasma parameters was eliminated using a simple method of scaling the results. Finally, the reliable plasma parameters were calculated.</p></abstract>

The resonant type power supplies of medium frequency designed for magnetron sputtering processes often use pulse density modulation to regulate the average discharge power level. While the output power level changes then number of pulses in a group changes, but the discharge current pulses are the same from pulse to pulse: their parameters (duration time, amplitude) do not change with the discharge power. The goal of this paper is to present the influence of medium frequency discharge power level on the direct current I-V characteristics of a single Langmuir probe and resulting plasma parameters caused by the pulse density modulation. The sputtering processes of titanium and copper were diagnosed at two spatial positions. The measured Langmuir probe I-V characteristics showed strong dependence on the discharge power. As the discharge powering pulses stay the same with the discharge power level change, such influence was unlikely to occur. Using time-resolved analysis of probe current waveforms the origin of this influence was indicated. The influence of discharge power level on the single probe Langmuir I-V characteristics and resulting plasma parameters was eliminated using a simple method of scaling the results. Finally, the reliable plasma parameters were calculated.

The impact of medium frequency pulsed magnetron discharge power on the single probe Langmuir measurements and resulted plasma parameters

Faculty of Microsystems Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego 11/17, 50-372 Wroclaw, Poland

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

The resonant type power supplies of medium frequency designed for magnetron sputtering processes often use pulse density modulation to regulate the average...

The impact of medium frequency pulsed magnetron discharge power on the single probe Langmuir measurements and resulted plasma parameters

Article Category: Research Article

Publié en ligne: 20 avr. 2016

Pages: 374 - 385

Reçu: 13 oct. 2015

Accepté: 22 nov. 2015

DOI: https://doi.org/10.1515/msp-2016-0012

Mots clés
titanium, copper, magnetron sputtering, pulsed magnetron sputtering, medium frequency pulsed magnetron sputtering, Langmuir probe measurements, Dora Power Systems

© 2016 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

The impact of medium frequency pulsed magnetron discharge power on the single probe Langmuir measurements and resulted plasma parameters

Article Category: Research Article

Publié en ligne: 20 avr. 2016

Pages: 374 - 385

Reçu: 13 oct. 2015

Accepté: 22 nov. 2015

DOI: https://doi.org/10.1515/msp-2016-0012

Mots cléstitanium, copper, magnetron sputtering, pulsed magnetron sputtering, medium frequency pulsed magnetron sputtering, Langmuir probe measurements, Dora Power Systems

© 2016 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Mots clés
titanium, copper, magnetron sputtering, pulsed magnetron sputtering, medium frequency pulsed magnetron sputtering, Langmuir probe measurements, Dora Power Systems