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Correlation of Selected Problems During Gan Movpe Epitaxy on si Substrates with in–Situ Interferometer Observation


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Tomasz Szymański
The Faculty of Microsystem Electronics and Photonics, Wroc law University of Technology, Janiszewskiego 11/17, 50-372 Wroc law, Poland
Mateusz Wośko
The Faculty of Microsystem Electronics and Photonics, Wroc law University of Technology, Janiszewskiego 11/17, 50-372 Wroc law, Poland
Bogdan Paszkiewicz
The Faculty of Microsystem Electronics and Photonics, Wroc law University of Technology, Janiszewskiego 11/17, 50-372 Wroc law, Poland
Kornelia Indykiewicz
The Faculty of Microsystem Electronics and Photonics, Wroc law University of Technology, Janiszewskiego 11/17, 50-372 Wroc law, Poland
Regina Paszkiewicz
The Faculty of Microsystem Electronics and Photonics, Wroc law University of Technology, Janiszewskiego 11/17, 50-372 Wroc law, Poland
eISSN:
1339-309X
Sprache:
Englisch
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6 Hefte pro Jahr
Fachgebiete der Zeitschrift:
Technik, Einführungen und Gesamtdarstellungen, andere