<abstract xmlns="http://www.w3.org/1999/xhtml"><p>In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.</p></abstract>

In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.

Second order reflection from crystals used in soft X-ray spectroscopy

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{"article-title":"Second order reflection from crystals used in soft X-ray spectroscopy"}

In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line...

Second order reflection from crystals used in soft X-ray spectroscopy

Online veröffentlicht: 22. Juni 2015

Seitenbereich: 263 - 265

Eingereicht: 12. Mai 2014

Akzeptiert: 05. Okt. 2014

DOI: https://doi.org/10.1515/nuka-2015-0046

Schlüsselwörter
soft X-ray, plasma spectroscopy, PbSt, KAP

© Ireneusz Książek

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Second order reflection from crystals used in soft X-ray spectroscopy

Online veröffentlicht: 22. Juni 2015

Seitenbereich: 263 - 265

Eingereicht: 12. Mai 2014

Akzeptiert: 05. Okt. 2014

DOI: https://doi.org/10.1515/nuka-2015-0046

Schlüsselwörtersoft X-ray, plasma spectroscopy, PbSt, KAP

© Ireneusz Książek

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Schlüsselwörter
soft X-ray, plasma spectroscopy, PbSt, KAP