<abstract xmlns="http://www.w3.org/1999/xhtml"><p>In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.</p></abstract>

In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.

Second order reflection from crystals used in soft X-ray spectroscopy

Institute of Physics, Opole University, 48 Oleska Str., 45-052 Opole, Poland, Tel.: +48 77 452 7263, Fax: +48 77 452 7290

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{"article-title":"Second order reflection from crystals used in soft X-ray spectroscopy"}

In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line...

Second order reflection from crystals used in soft X-ray spectroscopy

Publicado en línea: 22 jun 2015

Páginas: 263 - 265

Recibido: 12 may 2014

Aceptado: 05 oct 2014

DOI: https://doi.org/10.1515/nuka-2015-0046

Palabras clave
soft X-ray, plasma spectroscopy, PbSt, KAP

© Ireneusz Książek

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Second order reflection from crystals used in soft X-ray spectroscopy

Publicado en línea: 22 jun 2015

Páginas: 263 - 265

Recibido: 12 may 2014

Aceptado: 05 oct 2014

DOI: https://doi.org/10.1515/nuka-2015-0046

Palabras clavesoft X-ray, plasma spectroscopy, PbSt, KAP

© Ireneusz Książek

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Palabras clave
soft X-ray, plasma spectroscopy, PbSt, KAP