I-cored Coil Probe Located Above a Conductive Plate with a Surface Hole
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07. März 2018
Über diesen Artikel
Online veröffentlicht: 07. März 2018
Seitenbereich: 7 - 12
Eingereicht: 25. Okt. 2017
Akzeptiert: 12. Feb. 2018
DOI: https://doi.org/10.1515/msr-2018-0002
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© 2018 Grzegorz Tytko et al., published by De Gruyter Open
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Tytko, Grzegorz
Institute of Electronics, Faculty of Automatic Control, Electronics and Computer Science, The Silesian University of TechnologyGliwice, Poland
Dziczkowski, Leszek
Institute of Electronics, Faculty of Automatic Control, Electronics and Computer Science, The Silesian University of TechnologyGliwice, Poland