Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests

Published Online: Oct 06, 2008

Page range: 329 - 339

DOI: https://doi.org/10.2478/v10006-008-0030-y

Keywords

random-access memory (RAM), memory testing, March memory test, neighbourhood pattern sensitive faults, memory address, memory background, Gray code, Hamming distance

This content is open access.