Method of determination of palladium concentration for C-Pd nanostructural films as a function of film thickness, roughness and topography

Published Online: Jul 22, 2014

Page range: 228 - 235

DOI: https://doi.org/10.2478/s13536-013-0194-5

Keywords

palladium, carbon, SEM, EDX

© 2014 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.