Cite

[1] Beck W. A., Anderson J. R., J. Appl. Phys. 62 (1987), 541. http://dx.doi.org/10.1063/1.33978010.1063/1.339780Search in Google Scholar

[2] Meyer J. R., Hoffman C. A., Antoszewski J., Faraone L., J. Appl. Phys. 81 (1997), 709. http://dx.doi.org/10.1063/1.36421110.1063/1.364211Search in Google Scholar

[3] Antoszewski J., Dell J. M., L. Faraone, Tan L. S., Raman A., Chua S. J, Holmes D. S., Lindemuth J. R., Meyer J. R., Mat. Sci. and Eng. B 44 (1997), 65. http://dx.doi.org/10.1016/S0921-5107(96)01808-910.1016/S0921-5107(96)01808-9Search in Google Scholar

[4] Antoszewski J., Seymour D. J., Faraone L., Meyer J. R., Hoffman C. A., J. Electron. Mater. 24 (1995), 1255. http://dx.doi.org/10.1007/BF0265308210.1007/BF02653082Search in Google Scholar

[5] Lisesivdin S. B., Yildiz A., Acar S., Kasap M., Ozcelik S., Ozbay E., Appl. Phys. Lett. 91 (2007), 102113. http://dx.doi.org/10.1063/1.277845310.1063/1.2778453Search in Google Scholar

[6] Meyer J. R., Hoffman C. A., Antoszewski J., Faraone L., J. Appl. Phys. 81 (1997), 709. http://dx.doi.org/10.1063/1.36421110.1063/1.364211Search in Google Scholar

[7] Lin Y., Arehart A. R., Carlin A. M., Ringelb S. A., Appl. Phys. Lett. 93 (2008), 062109. http://dx.doi.org/10.1063/1.297004510.1063/1.2970045Search in Google Scholar

[8] Lisesivdin S. B., Altuntas H., Yildiz A., Kasap M., Ozbay E., Ozcelik S., Superlattices and Microstructures 45 (2009), 604. http://dx.doi.org/10.1016/j.spmi.2009.02.00910.1016/j.spmi.2009.02.009Search in Google Scholar

[9] Wei W., Solid State Sciences 12 (2010), 789. http://dx.doi.org/10.1016/j.solidstatesciences.2010.02.01810.1016/j.solidstatesciences.2010.02.018Search in Google Scholar

[10] Stephenson G. B., Eastman J. A., Thompson C., Auciello O., Thompson L. J., Munkholm A., Fini P., Denbaars S. P., Speck J. S., Appl. Phys. Lett. 74 (1999), 3326. http://dx.doi.org/10.1063/1.12333310.1063/1.123333Search in Google Scholar

[11] Lisesivdin S. B., Acar S., Kasap M., Ozcelik S., Gokden S., Ozbay E., Semicond. Sci. Technol. 22 (2007), 543. http://dx.doi.org/10.1088/0268-1242/22/5/01510.1088/0268-1242/22/5/015Search in Google Scholar

[12] Lorenz K., Gonsalves M., Wook K., Narayanan V., Mahajan S., Appl. Phys. Lett. 77 (2000), 3391. http://dx.doi.org/10.1063/1.132809110.1063/1.1328091Search in Google Scholar

[13] Wickenden A. E., Koleske D. D., Henry R. L., Twigg M. E., Fatemi M., J. Crysc. Growth 260 (2004), 54. http://dx.doi.org/10.1016/j.jcrysgro.2003.08.02410.1016/j.jcrysgro.2003.08.024Search in Google Scholar

[14] Smorchkova I. P., Elsass C. R., Ibbetson J. P., Vetury R., Heying B., Fini P., Haus E., Denbaars S.P., Speck J. S., Mishra U. K., J. Appl. Phys. 86 (1999), 4520. http://dx.doi.org/10.1063/1.37139610.1063/1.371396Search in Google Scholar

[15] Nhat Luang D., Huyen Tung N., Thanh Tien N., J. Appl. Phys. 109, (2011), 113711. http://dx.doi.org/10.1063/1.359218710.1063/1.3592187Search in Google Scholar

[16] Carosella F., Farvacque J. L., J. Phys.: Condens. Matter 20 (2008), 325210. 10.1088/0953-8984/20/32/325210Search in Google Scholar

eISSN:
2083-124X
ISSN:
2083-1331
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties