<abstract xmlns="http://www.w3.org/1999/xhtml">

<p>This article presents measurement circuits and a test board developed for the experimental evaluation of prototype chip samples of the Fully Differential Difference Amplifier (FDDA). The Device Under Test (DUT) is an ultra low-voltage, high performance integrated FDDA designed and fabricated in 130nm CMOS technology. The power supply voltage of the FDDA is 400mV. The measurement circuits were implemented on the test board with the fabricated FDDA chip to evaluate its main parameters and properties. In this work, we focus on evaluation of the following parameters: the input offset voltage, the common-mode rejection ratio, and the power supply rejection ratio. The test board was developed and verified. The test board error was measured to be 38.73mV. The offset voltage of the FDDA was −0.66mV. The measured FDDA gain and gain bandwidth were 48dB and 550kHz, respectively. In addition to the measurement board, a graphical user interface was also developed to simplify the control of the device under test during measurements.</p>
</abstract>

This article presents measurement circuits and a test board developed for the experimental evaluation of prototype chip samples of the Fully Differential Difference Amplifier (FDDA). The Device Under Test (DUT) is an ultra low-voltage, high performance integrated FDDA designed and fabricated in 130nm CMOS technology. The power supply voltage of the FDDA is 400mV. The measurement circuits were implemented on the test board with the fabricated FDDA chip to evaluate its main parameters and properties. In this work, we focus on evaluation of the following parameters: the input offset voltage, the common-mode rejection ratio, and the power supply rejection ratio. The test board was developed and verified. The test board error was measured to be 38.73mV. The offset voltage of the FDDA was −0.66mV. The measured FDDA gain and gain bandwidth were 48dB and 550kHz, respectively. In addition to the measurement board, a graphical user interface was also developed to simplify the control of the device under test during measurements.

Measurement Approach to Evaluation of Ultra-Low-Voltage Amplifier ASICs

Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology

Measurement Science Review

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

{"article-title":"Measurement Approach to Evaluation of Ultra-Low-Voltage Amplifier ASICs"}

This article presents measurement circuits and a test board developed for the experimental evaluation of prototype chip samples of the Fully Differential...

Measurement Approach to Evaluation of Ultra-Low-Voltage Amplifier ASICs

Published Online: Mar 07, 2024

Page range: 9 - 16

Received: Jul 02, 2023

Accepted: Oct 25, 2023

DOI: https://doi.org/10.2478/msr-2024-0002

Keywords
Integrated circuit testing, measurement board, input offset voltage, Common-Mode Rejection Ratio (CMRR), Power Supply Rejection Ratio (PSRR), Fully Differential Difference Amplifier (FDDA)

© 2024 Richard Ravasz et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Measurement Approach to Evaluation of Ultra-Low-Voltage Amplifier ASICs

Published Online: Mar 07, 2024

Page range: 9 - 16

Received: Jul 02, 2023

Accepted: Oct 25, 2023

DOI: https://doi.org/10.2478/msr-2024-0002

KeywordsIntegrated circuit testing, measurement board, input offset voltage, Common-Mode Rejection Ratio (CMRR), Power Supply Rejection Ratio (PSRR), Fully Differential Difference Amplifier (FDDA)

© 2024 Richard Ravasz et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Keywords
Integrated circuit testing, measurement board, input offset voltage, Common-Mode Rejection Ratio (CMRR), Power Supply Rejection Ratio (PSRR), Fully Differential Difference Amplifier (FDDA)