Login
Registrati
Reimposta password
Pubblica & Distribuisci
Soluzioni Editoriali
Soluzioni di Distribuzione
Temi
Architettura e design
Arti
Business e Economia
Chimica
Chimica industriale
Farmacia
Filosofia
Fisica
Geoscienze
Ingegneria
Interesse generale
Legge
Letteratura
Linguistica e semiotica
Matematica
Medicina
Musica
Scienze bibliotecarie e dell'informazione, studi library
Scienze dei materiali
Scienze della vita
Scienze informatiche
Scienze sociali
Sport e tempo libero
Storia
Studi classici e del Vicino Oriente antico
Studi culturali
Studi ebraici
Teologia e religione
Pubblicazioni
Riviste
Libri
Atti
Editori
Blog
Contatti
Cerca
EUR
USD
GBP
Italiano
English
Deutsch
Polski
Español
Français
Italiano
Carrello
Home
Riviste
Measurement Science Review
Volume 24 (2024): Numero 1 (February 2024)
Accesso libero
Measurement Approach to Evaluation of Ultra-Low-Voltage Amplifier ASICs
Richard Ravasz
Richard Ravasz
,
Miroslav Potočný
Miroslav Potočný
,
Daniel Arbet
Daniel Arbet
,
Martin Kováč
Martin Kováč
,
David Maljar
David Maljar
,
Lukáš Nagy
Lukáš Nagy
e
Viera Stopjaková
Viera Stopjaková
| 07 mar 2024
Measurement Science Review
Volume 24 (2024): Numero 1 (February 2024)
INFORMAZIONI SU QUESTO ARTICOLO
Articolo precedente
Articolo Successivo
Sommario
Bibliografia
Autori
Articoli in questo Numero
Anteprima
PDF
Cita
CONDIVIDI
Pubblicato online:
07 mar 2024
Pagine:
9 - 16
Ricevuto:
02 lug 2023
Accettato:
25 ott 2023
DOI:
https://doi.org/10.2478/msr-2024-0002
Parole chiave
Integrated circuit testing
,
measurement board
,
input offset voltage
,
Common-Mode Rejection Ratio (CMRR)
,
Power Supply Rejection Ratio (PSRR)
,
Fully Differential Difference Amplifier (FDDA)
© 2024 Richard Ravasz et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Richard Ravasz
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
Bratislava, Slovakia
Miroslav Potočný
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
Bratislava, Slovakia
Daniel Arbet
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
Bratislava, Slovakia
Martin Kováč
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
Bratislava, Slovakia
David Maljar
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
Bratislava, Slovakia
Lukáš Nagy
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
Bratislava, Slovakia
Viera Stopjaková
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
Bratislava, Slovakia