1. bookVolume 38 (2020): Issue 2 (June 2020)
Journal Details
License
Format
Journal
eISSN
2083-134X
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
Open Access

Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis

Published Online: 06 Oct 2020
Volume & Issue: Volume 38 (2020) - Issue 2 (June 2020)
Page range: 334 - 340
Received: 21 Aug 2018
Accepted: 23 Apr 2019
Journal Details
License
Format
Journal
eISSN
2083-134X
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
Abstract

A nanoscale investigation of three-dimensional (3-D) surface micromorphology of archetypical N, N0- bis (n-etyl) x:y, dicyanoperylene- 3, 4:9, 10 bis (dicarboximide) (PDI8-CN2) thin films on H-Si substrates, which are applicable in n-type semiconducting compounds, has been performed by using fractal analysis. In addition, surface texture characteristics of the PDI8-CN2 thin films have been characterized by using atomic force microscopy (AFM) operated in tapping-mode in the air. These analyses revealed that all samples can be described well as fractal structures at nanometer scale and their three dimensional surface texture could be implemented in both graphical models and computer simulations.

Keywords

[1] Buzio R., Gerbi A., Marrè D., Barra M., Cassinese A., Organic Electron, 18 (2015), 44.10.1016/j.orgel.2015.01.007Search in Google Scholar

[2] Youn J., Dholakia G.R., Huang H., Hennek J.W., Facchetti A., Marks T.J., Adv. Funct. Materials, 22 (2012), 1856.10.1002/adfm.201102312Search in Google Scholar

[3] Torsi L., Dodabalapur A., Anal. Chemistry., 77 (2005), 380 A.10.1021/ac053475n16247934Search in Google Scholar

[4] Katz H. E., Hong X. M., Dodabalapur A., Sarpeshkar R., J. Appl. Physics, 91(2002), 1572.10.1063/1.1427136Search in Google Scholar

[5] Kitamu M., Imada T., Arakawa Y., Jpn. J. Appl. Physics, 42(2003), 4B.10.1143/JJAP.42.2483Search in Google Scholar

[6] Liscio F., Milita S., Albonetti C., Angelo P. D., Guagliardi A., Masciocchi N., Della Valle R.G., Venuti E., Brillante A., Biscarini F., Adv. Funct. Materials, 22 (2012) 943.Search in Google Scholar

[7] Di Girolamo F.V., Ciccullo F., Barra M., Carella A., Cassinese A., Org. Electron, 13 (2012), 2281.10.1016/j.orgel.2012.06.044Search in Google Scholar

[8] Barra M., Di Girolamo F.V., Chiarella F., Salluzzo M., Chen Z., Facchetti A., Anderson L., Cassinese A., J. Phys. Chemistry C, 114 (2010), 20387.10.1021/jp103555xSearch in Google Scholar

[9] Buzio R., Gerbi A., Gadaleta A., Anghinolfi L., Bisio F., Bellingeri E., Siri A.S., Marrè D., Appl. Phys. Letter, 101(2012), 243505.10.1063/1.4771603Search in Google Scholar

[10] Gerbi A., Buzio R., Gadaleta A., Anghinolfi L., Caminale M., Bellingeri E., Siri A.S., Marrè D., Adv. Mater. Interfaces, 1(2014) 1300057.10.1002/admi.201300057Search in Google Scholar

[11] Ţălu Ş., Napoca Star Publishing House, Cluj-Napoca, Romania, 2015.Search in Google Scholar

[12] Ramazanov S., Ţălu Ş., Sobola D., Stach S., Ramazanov G., Superlattice Microstructure, 86 (2015), 395.Search in Google Scholar

[13] Arman A., Ţălu Ş., Luna C., Ahmadpourian A., Naseri M., Molamohammadi M., J. Mater. Sci. Mater. Electron., 26 (2015), 9630.10.1007/s10854-015-3628-5Search in Google Scholar

[14] Nayak P.R., J. of Lubrication Tech. 93 (1971), 398.10.1115/1.3451608Search in Google Scholar

[15] Dong W.P., Sullivan P.J., Stout K.J., Wear, 178 (1994), 45.10.1016/0043-1648(94)90128-7Search in Google Scholar

[16] Thomas A., Thomas T.R., Journal of Wave Material Interaction, 3 (1988), 341.10.1177/109114218801600306Search in Google Scholar

[17] Ţălu Ş., Bramowicz M., Kulesza S., Dalouji V., Solaymani S., Valedbagi S., Microsc. Res. Tech., 79(12) (2016), 1208.10.1002/jemt.2277927639345Search in Google Scholar

[18] Ţălu Ş., Bramowicz M., Kulesza S., Ghaderi A., Solaymani S., Savaloni H., Babaei R., J. Ind. Eng. Chem., 43 (2016) 164.Search in Google Scholar

[19] Naseri N., Solaymani S., Ghaderi A., Bramowicz M., Kulesza S., Ţălu Ş., Pourreza M., Ghasemi S., RSC Adv., 7 (2017), 12923.10.1039/C6RA28795FSearch in Google Scholar

[20] Ţălu Ş., Stach S., Polym. Eng. Sci. 54(5) (2014), 1066.10.1002/pen.23650Search in Google Scholar

[21] Berezina S., Il’icheva A.A., Podzorova L.I., Ţălu Ş., Microsc. Res. Tech., 78 (2015), 840.10.1002/jemt.2254826190812Search in Google Scholar

[22] Ţălu Ş., Polym. Eng. Sci., 53(10) (2013), 2141.Search in Google Scholar

[23] Lombardo M., Ţălu Ş., Ţălu M., Serrao S., Ducoli P., J Cataract Refract Surg., 36(9) (2010), 1573.10.1016/j.jcrs.2010.06.03120692572Search in Google Scholar

[24] Stach S., Ţălu Ş., Trabattoni S., Tavazzi S., Głuchaczka A., Siek P., Zaj ac J., Giovanzana S., Curr Eye Res., 42(4)(2017), 498.10.1080/02713683.2016.121754627610546Search in Google Scholar

[25] Kulesza S., Bramowicz M., Czaja P., Jabłoński R., Kropiwnicki J., Charkiewicz M., Acta Phys. Polonica A, 130 (2016), 1013.10.12693/APhysPolA.130.1013Search in Google Scholar

[26] Ţălu Ş., Bramowicz M., Kulesza S., Lainović T., Vilotić M., Blažić L., Journal of Microscopy, 264 (2016), 198.10.1111/jmi.1243227312957Search in Google Scholar

[27] Vranceanu D.M., Cotrut C.M., Bramowicz M., Titorencu I., Kulesza S., Kiss A., Berbecaru A., Pruna V., Branzei M., Vladescu A., Ceram. Int., 42 (2016), 10085.10.1016/j.ceramint.2016.03.114Search in Google Scholar

[28] Méndez A., Reyes Y., Trejo G., Stępień K., Ţălu Ş., Microsc. Res. Tech., 78 (2015), 1082.10.1002/jemt.22588505729426500164Search in Google Scholar

[29] Ţălu Ş., Stach S., Valedbagi S., Elahi S.M., Bavadi R., Mater. Sci. Poland, 33(1)(2015), 137.10.1515/msp-2015-0010Search in Google Scholar

[30] Gwyddion 2.37 software (Copyright © 2004-2007, 2009-2014 Petr Klapetek, David Nečas, Christopher An-derson). Available from: http://gwyddion.net (last accessed January 10th, 2018).Search in Google Scholar

[31] Sobola D., Ţălu Ş., Solaymani S., Grmela L., Microsc. Res. Tech., 80(12) (2017), 1328.10.1002/jemt.2294528905452Search in Google Scholar

[32] Stach S., Garczyk Z., Ţălu Ş., Solaymani S., Ghaderi A., Moradian R., Nezafat N.B., Elahi S.M., Gholamali H., J. Phys. Chem. C, 119(31) (2015) 17887.10.1021/acs.jpcc.5b04676Search in Google Scholar

[33] Stach S., Sapota W., Ţălu Ş., Ahmadpourian A., Luna C., Ghobadi N., Arman A., Ganji M., J. Mater. Sci. Mater. Electron, 28(2) (2016), 2113.10.1007/s10854-016-5774-9Search in Google Scholar

Recommended articles from Trend MD

Plan your remote conference with Sciendo