Investigation of Silicon Carbide Polytypes by Raman Spectroscopy

Published Online: Jul 16, 2014

Page range: 51 - 57

DOI: https://doi.org/10.2478/lpts-2014-0019

Keywords

Silicon carbide (SiC), polytypes, Raman spectroscopy, X-ray diffraction (XRD)

© by G. Chikvaidze

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.