Investigation of Silicon Carbide Polytypes by Raman Spectroscopy

Pubblicato online: 16 lug 2014

Pagine: 51 - 57

DOI: https://doi.org/10.2478/lpts-2014-0019

Parole chiave

Silicon carbide (SiC), polytypes, Raman spectroscopy, X-ray diffraction (XRD)

© by G. Chikvaidze

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.