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Journals
Journal of Electrical Engineering
Volume 75 (2024): Issue 2 (April 2024)
Open Access
Automatic test-bench for SiC power devices using LabVIEW
Jan Leuchter
Jan Leuchter
,
Ngoc Nam Pham
Ngoc Nam Pham
and
Huy Hoang Nguyen
Huy Hoang Nguyen
| Apr 04, 2024
Journal of Electrical Engineering
Volume 75 (2024): Issue 2 (April 2024)
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Published Online:
Apr 04, 2024
Page range:
77 - 85
Received:
Jan 16, 2024
DOI:
https://doi.org/10.2478/jee-2024-0011
Keywords
power electronic devices
,
SiC
,
LabVIEW
,
PSpice
,
Spice model
© 2024 Jan Leuchter et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Jan Leuchter
Department of Microelectronics, Brno University of Technology,
Brno, Czech Republic
Faculty of Transport Engineering, University of Pardubice,
Pardubice, Czech Republic
Ngoc Nam Pham
Institute of System Integration, Le Quy Don Technical University,
Hanoi, Vietnam
Huy Hoang Nguyen
Institute of System Integration, Le Quy Don Technical University,
Hanoi, Vietnam