Open Access

Automatic test-bench for SiC power devices using LabVIEW

Jan Leuchter

Jan Leuchter

  • Department of Microelectronics, Brno University of TechnologyBrno, Czech Republic
  • Faculty of Transport Engineering, University of PardubicePardubice, Czech Republic
Search for this author on
Sciendo|Google Scholar
Leuchter, Jan
, 
Ngoc Nam Pham

Ngoc Nam Pham

Institute of System Integration, Le Quy Don Technical UniversityHanoi, Vietnam
Search for this author on
Sciendo|Google Scholar
Pham, Ngoc Nam
 and 
Huy Hoang Nguyen

Huy Hoang Nguyen

Institute of System Integration, Le Quy Don Technical UniversityHanoi, Vietnam
Search for this author on
Sciendo|Google Scholar
Nguyen, Huy Hoang
  
Apr 04, 2024
Automatic test-bench for SiC power devices using LabVIEW's Cover Image
About this article
Previous Article
Next Article
Cite
Download Cover
Published Online: Apr 04, 2024
Page range: 77 - 85
Received: Jan 16, 2024
DOI: https://doi.org/10.2478/jee-2024-0011
Keywords
© 2024 Jan Leuchter et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Language:
English
Publication timeframe:
6 times per year
Journal Subjects:
Engineering, Introductions and Overviews, Engineering, other
Journal RSS Feed