<abstract xmlns="http://www.w3.org/1999/xhtml">
<p>This paper is devoted to the improvement existing models of electronics devices, which are used in powers electronics as switching devices, and investigate a LabVIEW-based automatic test-bench for Silicon carbide (SiC) power devices. In recent years, power electronic devices are required to be capable handle with higher voltage, leads to development of new generation of power electronic devices, such as SiC devices. However, using a simulation platform, such as Spice, to diminish the complexity of power electronic design with these new devices is hindered by the lack of precise models. The proposed test-bench enables not only measuring static characteristics of SiC power devices, but also extracting key parameters required by simulations. These extracted parameters are then employed in the existing device model, and the simulation results which are based on the model with original parameters and models with extracted parameters are compared with measured results. The comparison clearly demonstrates that parameters obtained from the proposed test-bench significantly enhance the Spice model.</p>
</abstract>

This paper is devoted to the improvement existing models of electronics devices, which are used in powers electronics as switching devices, and investigate a LabVIEW-based automatic test-bench for Silicon carbide (SiC) power devices. In recent years, power electronic devices are required to be capable handle with higher voltage, leads to development of new generation of power electronic devices, such as SiC devices. However, using a simulation platform, such as Spice, to diminish the complexity of power electronic design with these new devices is hindered by the lack of precise models. The proposed test-bench enables not only measuring static characteristics of SiC power devices, but also extracting key parameters required by simulations. These extracted parameters are then employed in the existing device model, and the simulation results which are based on the model with original parameters and models with extracted parameters are compared with measured results. The comparison clearly demonstrates that parameters obtained from the proposed test-bench significantly enhance the Spice model.

Automatic test-bench for SiC power devices using LabVIEW

Department of Microelectronics, Brno University of Technology

Faculty of Transport Engineering, University of Pardubice

Institute of System Integration, Le Quy Don Technical University

Journal of Electrical Engineering

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

{"article-title":"Automatic test-bench for SiC power devices using LabVIEW"}

This paper is devoted to the improvement existing models of electronics devices, which are used in powers electronics as switching devices, and investigate a...

Automatic test-bench for SiC power devices using LabVIEW

Publié en ligne: 04 avr. 2024

Pages: 77 - 85

Reçu: 16 janv. 2024

DOI: https://doi.org/10.2478/jee-2024-0011

Mots clés
power electronic devices, SiC, LabVIEW, PSpice, Spice model

© 2024 Jan Leuchter et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Automatic test-bench for SiC power devices using LabVIEW

Publié en ligne: 04 avr. 2024

Pages: 77 - 85

Reçu: 16 janv. 2024

DOI: https://doi.org/10.2478/jee-2024-0011

Mots cléspower electronic devices, SiC, LabVIEW, PSpice, Spice model

© 2024 Jan Leuchter et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Mots clés
power electronic devices, SiC, LabVIEW, PSpice, Spice model