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Nukleonika
Volume 61 (2016): Issue 2 (June 2016)
Open Access
Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors
Alfio Torrisi
Alfio Torrisi
,
Przemysław Wachulak
Przemysław Wachulak
,
Lorenzo Torrisi
Lorenzo Torrisi
,
Andrzej Bartnik
Andrzej Bartnik
,
Łukasz Węgrzyński
Łukasz Węgrzyński
and
Henryk Fiedorowicz
Henryk Fiedorowicz
| Jun 15, 2016
Nukleonika
Volume 61 (2016): Issue 2 (June 2016)
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Published Online:
Jun 15, 2016
Page range:
139 - 143
Received:
Sep 24, 2015
Accepted:
Dec 01, 2015
DOI:
https://doi.org/10.1515/nuka-2016-0024
© by Alfio Torrisi
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Alfio Torrisi
Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego Str., 00-908 Warsaw, Poland
Przemysław Wachulak
Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego Str., 00-908 Warsaw, Poland
Lorenzo Torrisi
Department of Physics Sciences – MIFT, University of Messina, V. le F. S. d’Alcontres 31, 981 66 S. Agata, Messina, Italy
Andrzej Bartnik
Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego Str., 00-908 Warsaw, Poland
Łukasz Węgrzyński
Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego Str., 00-908 Warsaw, Poland
Henryk Fiedorowicz
Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego Str., 00-908 Warsaw, Poland