Operation modes of the FALCON ion source as a part of the AMS cluster tool
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Jun 22, 2015
About this article
Published Online: Jun 22, 2015
Page range: 327 - 330
Received: May 19, 2014
Accepted: May 05, 2015
DOI: https://doi.org/10.1515/nuka-2015-0059
Keywords
© Oleksii Girka et al.
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
The paper investigates the options to increase the production yield of temperature compensated surface acoustic wave (SAW) devices with a defined range of operational frequencies. The paper focuses on the preparation of large wafers with SiO2 and AlN/Si3N4 depositions. Stability of the intermediate SiO2 layer is achieved by combining high power density UV radiation with annealing in high humidity environment. A uniform thickness of the capping AlN layer is achieved by local high-rate etching with a focused ion beam emitted by the FALCON ion source. Operation parameters and limitations of the etching process are discussed.