Published Online: Jun 22, 2015
Page range: 263 - 265
Received: May 12, 2014
Accepted: Oct 05, 2014
DOI: https://doi.org/10.1515/nuka-2015-0046
Keywords
© Ireneusz Książek
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.