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Measurement Science Review
Volume 16 (2016): Issue 5 (October 2016)
Open Access
Automatic Parameter Extraction Technique for MOS Structures by C-V Characterization Including the Effects of Interface States
D. V. Ryazantsev
D. V. Ryazantsev
and
V. P. Grudtsov
V. P. Grudtsov
| Oct 26, 2016
Measurement Science Review
Volume 16 (2016): Issue 5 (October 2016)
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Published Online:
Oct 26, 2016
Page range:
266 - 272
Received:
Mar 02, 2016
Accepted:
Oct 06, 2016
DOI:
https://doi.org/10.1515/msr-2016-0033
Keywords
C-V measurement
,
parameter extraction
,
interface states
,
quantum simulation
,
MOS
© 2016 D. V. Ryazantsev et al., published by De Gruyter Open
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.