Open Access

Characterization of deep-level defects in GaNAs/GaAs heterostructures grown by APMOVPE

Łukasz Gelczuk

Łukasz Gelczuk

Poland
Search for this author on
Sciendo|Google Scholar
Gelczuk, Łukasz
, 
Maria Dąbrowska-Szata

Maria Dąbrowska-Szata

Poland
Search for this author on
Sciendo|Google Scholar
Dąbrowska-Szata, Maria
, 
Beata Ściana

Beata Ściana

Poland
Search for this author on
Sciendo|Google Scholar
Ściana, Beata
, 
Damian Pucicki

Damian Pucicki

Poland
Search for this author on
Sciendo|Google Scholar
Pucicki, Damian
, 
Damian Radziewicz

Damian Radziewicz

Poland
Search for this author on
Sciendo|Google Scholar
Radziewicz, Damian
, 
Krzysztof Kopalko

Krzysztof Kopalko

Poland
Search for this author on
Sciendo|Google Scholar
Kopalko, Krzysztof
 and 
Marek Tłaczała

Marek Tłaczała

Poland
Search for this author on
Sciendo|Google Scholar
Tłaczała, Marek
  
Dec 19, 2016
Characterization of deep-level defects in GaNAs/GaAs heterostructures grown by APMOVPE's Cover Image
About this article
Previous Article
Next Article
Cite
Download Cover
Published Online: Dec 19, 2016
Page range: 726 - 734
Received: Dec 18, 2015
Accepted: Nov 02, 2016
DOI: https://doi.org/10.1515/msp-2016-0126
Keywords
© Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties
Journal RSS Feed