Zacytuj

[1] HURST, S. : VLSI Testing, Digital and Mixed Analogue/Digital Techniques, The Institution of Electrical Engineers, London, UK, 1988.Search in Google Scholar

[2] ARABI, K.-KAMINSKA, B. : Oscillation-Test Strategy for Analog and Mixed-Signal Integrated Circuits, Proc. of the 14th IEEE VLSI Test Symposium (VTS 96), Princeton, New Jersey, April/May 1996, pp. 476-482.Search in Google Scholar

[3] ALLI, P. K. : Testing a CMOS Operational Amplifier Circuit Using a Combination of Oscillation and Iddq Test Methods, MSc Thesis, Louisiana State University, USA, 2004.Search in Google Scholar

[4] HU, G.-WANG, H.-HU, M.-YANG, S. : Oscillation Test Strategy for Analog Filters by Monitoring Output Voltage and Supply Current, Thinghua Science and Technology 12 No. S1 (July 2007), 78-82.10.1016/S1007-0214(07)70088-3Search in Google Scholar

[5] LITOVSKI, V.-ANDREJEVI´C, M.-ZWOLINSKI, M. : Ana- logue Electronic Circuit Diagnosis Based on ANNs, Microelec- tronics Reliability, Elsevier 46 No. 8 (Aug 2006), 1382-1391.10.1016/j.microrel.2005.11.008Search in Google Scholar

[6] ANDREJEVI´C STOˇSOVI´C, M.-MILOVANOVI´C, D.-LI- TOVSKI, V. : Hierarchical Approach to Diagnosis of Mixed- Mode Circuits using Artificial Neural Networks, Neural Net- work World, Institute of Computer Science AS CR, v.v.i. and Faculty of Transportation Sciences 21 No. 2 (2011), 153-168.Search in Google Scholar

[7] ARABI, K.-KAMINSKA, B. : Efficient and Accurate Testing of Analog-to-Digital Converters using Oscillation-Test Method, Proc. of the European Design and Test Conference (ED&TC 97), Paris, France, March 1997, pp. 348-352.Search in Google Scholar

[8] ARABI, K.-KAMINSKA, B. : Oscillation-Test Methodology for Low-Cost Testing of Active Filters, IEEE Trans. on Instru- mentation and Measurements 48 No. 4 (Aug 1999), 798-806.10.1109/19.779176Search in Google Scholar

[9] DAS, S. et al : Testing Analog and Mixed-Signal Circuits with Built-in Hardware - A New Approach, IEEE Trans. on Instru- mentation and Measurement 56 No. 3 (June 2007), 840-855.10.1109/TIM.2007.894223Search in Google Scholar

[10] HUELSMAN, L. P. : Active and Passive Analog Filter Design: An Introduction, McGraw-Hill College, 1993.Search in Google Scholar

[11] LITOVSKI, V.-ZWOLINSKI, M. : VLSI Circuits Simulation and Optimization, Chapman and Hall, London, 1997.Search in Google Scholar

[12] http://cds.linear.com/docs/Software%20and%20Simulation/ LTC6078-79.txt.Search in Google Scholar

[13] MILI´C, M.-ANDREJEVI´CSTOˇ SOVI´C, M.-LITOVSKI, V. : Oscillation Based Analog Testing - A Case Study, 34th Interna- tional Convention on Information and Communication Technol- ogy, Electronics and Microelectronics - MIPRO 2011, Opatija, Croatia, 23-27 May 2011.Search in Google Scholar

[14] CAI, J.-D.-YAN, R.-W. : Fault Diagnosis of Power Electronic Circuit Based on Random Forests Algorithm, Fifth IEEE Inter- national Conference on Natural Computation, Tianjin, China, 2009, pp. 214-217.10.1109/ICNC.2009.390Search in Google Scholar

[15] BENJAMINS, R.-JANSWEIJER, W. : Toward a Competence Theory of Diagnosis, IEEE Expert 9 No. 5 (1994), 43-52.10.1109/64.331489Search in Google Scholar

[16] PIPITONE, F.-DEJONG, K.-SPEARS, W. : An Artificial Intelligence Approach to Analogue System Diagnosis, in Liu, R.-W., editor, Testing and Diagnosis of Analog Circuits and Systems, Van Nostrand Reinhold, New York, 1991, pp. 187-215.10.1007/978-1-4615-9747-6_7Search in Google Scholar

[17] MAZUROVA, N. : Theoretical Background for theApplet-Based Exercises: Test Generation and Fault Diagnosis Bound- ary Scan, Tallinn Technical University, Faculty of Informa- tion Technology, Department of Computer Engineering, 2003, http://www.pld.ttu.ee/testing/theory/ LL-D&T%2BBS-lab Mazurova.pdf.Search in Google Scholar

[18] HAYASHI, S.-ASAKURA, T.-ZHANG, S. : Study of Ma- chine Fault Diagnosis System using Neural Networks, Proc. of the Int. Joint Conf. on Neural Networks, Honolulu, Hawaii, 2002, pp. 233-238.Search in Google Scholar

[19] GOLONEK, T.-RUTKOWSKI, J. : Use of Genetic Program- ming to Analog Fault Decoder Design, Proc. of the Int. Conf. on Signals and Electronic Systems, ICSES’02, Wroc law-´ Swierad´w Zdr´oj, Poland, 2002.Search in Google Scholar

[20] POUS, C.-COLOMER, J.-MEL´ENDEZ, J.-de la ROSA, J. L. : Introducing Qualitative Reasoning in Fault Dictionaries Techniques for Analog Circuit Analysis, Sixteenth International Workshop on Qualitative Reasoning, Barcelona, Spain, 2002.Search in Google Scholar

[21] SCARSELLI, F.-TSOI, A. C. : Universal Approximation us- ing Feed-Forward Neural Networks: A Survey of some Existing Methods and some New Results, Neural Networks, Elsevier 11 (1998), 15-37.Search in Google Scholar

[22] MANETTI, S.-PICCIRILLI, C. : A Singular-Value Decompo- sition Approach for Ambiguity Determination in Analog Cir- cuits, IEEE Trans. on Circuits and Systems, I: Fundamental Theory and Applications 50 No. 4 (Apr 2003), 477-487.10.1109/TCSI.2003.809811Search in Google Scholar

[23] BAUM, E. B.-HAUSSLER, D. : What Size Net Gives Valid Generalization, Neural Computing 1 (1989), 151-160.10.1162/neco.1989.1.1.151Search in Google Scholar

[24] MASTERS, T. : Practical Neural Network Recipes in C++, Academic Press, San Diego, 1993.10.1016/B978-0-08-051433-8.50017-3Search in Google Scholar

ISSN:
1335-3632
Język:
Angielski
Częstotliwość wydawania:
6 razy w roku
Dziedziny czasopisma:
Engineering, Introductions and Overviews, other