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Contribution to the Quantitative Analysis of Ternary Alloys of Group III-Nitrides by Auger Spectroscopy


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SEAH, M. P.: in: Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy (. D. Briggs and M.P. Seah, eds.), Wiley, Chichester, 1983.Search in Google Scholar

LIDAY, J.—HOFMANN, S.—HARMAN, R.: Vacuum 43 (1992), 331.10.1016/0042-207X(92)90166-TSearch in Google Scholar

SHIRLEY, D. A.: Phys. Rev. B5 (1972), 4709.10.1103/PhysRevB.5.4709Search in Google Scholar

TOUGARD, S.: Surf. Interface Anal. 25 (1997), 137.10.1002/(SICI)1096-9918(199703)25:3<137::AID-SIA230>3.0.CO;2-LSearch in Google Scholar

TOUGARD, S.: in: Surface Analysis by Auger and X-ray Photoelectron Spectroscopy (D. Briggs and J. T. Grant, eds.), IM Publications and Surface Spectra Limited, 2003.Search in Google Scholar

WITTMACK, K.: in: Practical Surface Analysis, Volume 2, Ion and Neutral Spectroscopy, (D. Briggs and M.P. Seah, eds.), Wiley & Sons, Chichester, 1992.Search in Google Scholar

SIGMUND, P.: in: Topics in Applied Physics, Vol 47 (R. Behrisch]publ Springer, ed.), Berlin, 1981.Search in Google Scholar

BETZ, G.—WEHNER, G. K.: in: Topics in Applied Physics, Vol 51 (R. Behrisch, ed.), Springer, Berlin, 1983.Search in Google Scholar

ANDERSEN, H. H.: in: Topics in Applied Physics, Vol 47 (R. Behrisch, ed.), Springer, Berlin, 1981.Search in Google Scholar

HOFMANN, S.: Progr. Surf. Sci. 36 (1991), 35.10.1016/0079-6816(91)90013-TSearch in Google Scholar

GNASER, H.: in: Springer Tracts in Modern Physics, Vol 146 (G. Hhler, ed.), Springer, Berlin, 1998.Search in Google Scholar

ZAPOROZCHENKO, V. I.—STEPANOVA, M. G.—VOJTUSSIK, S. S.: Vacuum 47 (1996), 421.10.1016/0042-207X(96)00002-4Search in Google Scholar

ECKE, G.—KOSIBA, R.—KHARLAMOV, V.—TRUSHIN, Y.—PEZOLDT, J.: Nucl. Instr. and Meth. B 196 (2002), 39.10.1016/S0168-583X(02)01273-9Search in Google Scholar

KOSIBA, R.—ECKE, G.—LIDAY, J.—BREZA, J.—AMBACHER, O.: Appl. Surf. Sci. 220 (2003), 304.10.1016/S0169-4332(03)00833-XSearch in Google Scholar

LIN, Y. J.—LI, Z. D.—HSU, Ch. W.—CHIEN, F. T.—LEE, Ch. T.—SHAO, S. T.—CHANG, H. Ch.: Appl. Phys. Lett. 82 (2003).10.1063/1.1569991Search in Google Scholar

ZE-JUN, D.—SHIMIZU, R.: In: Surface analysis by Auger and X-Ray Photoelectron Spectroscopy, IM Publications, 2003, pp. 587-618.Search in Google Scholar

SHIMIZU, R.: Japan Appl Phys 22 yr1983, 1631.10.1143/JJAP.22.1631Search in Google Scholar

TANUMA, S.—POWELL, C. J.—PENN, D. R.: Surf. Interface Anal. 21 (1993), 165.10.1002/sia.740210302Search in Google Scholar

JABLONSKI, A.: Surf. Sci. 499 (2002), 219.10.1016/S0039-6028(01)01851-9Search in Google Scholar

SHIMIZU, H.—ONO, M.—NAKAYAMA, K.: Surf. Sci. 36 (1973), 817.10.1016/0039-6028(73)90428-7Search in Google Scholar

ISSN:
1335-3632
Język:
Angielski
Częstotliwość wydawania:
6 razy w roku
Dziedziny czasopisma:
Engineering, Introductions and Overviews, other