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Grams J., Szynkowska M. I.: Applications of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) to Investigations of Metal/Support Catalysts, in Norris C.P. (Ed.), Focus on Surface Science Research, Nova Science Publishers, p. 69 - 97, 2005.Search in Google Scholar

Grams J., Góralski J., Kleczewska J., Szczepaniak B., Sobczak I., Kusior A.: Selected Examples of an Application of Time-of-Flight Secondary Ion Mass Spectrometry to Surface Investigations of Catalysts Utilized in the Environment Protection, Pol. J. Environ. Stud., 2006, 15(6A), 57.Search in Google Scholar

Grams J., Góralski J., Szczepaniak B., Paryjczak T.: The estimation of the chlorine content on the surface of Pd/ZrO2-Al2O3 catalyst by ToF-SIMS, Pol. J. Environ. Stud., 2005, 14(Suppl. IV), 89.Search in Google Scholar

Szczepaniak B., Góralski J., Grams J., Paryjczak T.: Badanie aktywności katalizatorów Pd/TiO2 w reakcji wodoroodchlorowaniaCCl4, Przem. Chem., 2006, 85(8 - 9), 764.Search in Google Scholar

Grams J., Góralski J., Szczepaniak B.: ToF-SIMS as a new technique for the investigations of deactivation process of hydrodechlorination catalysts, Russ. J. Phys. Chem., in press.Search in Google Scholar

Szczepaniak B., Góralski J., Grams J., Paryjczak T.: Influence of SMSI Effect on the Activity of Pd/TiO2 Catalysts in Hydrodechlorination Reaction with CCl4, Pol. J. Environ. Stud., 2006, 15(6A), 161.Search in Google Scholar

eISSN:
1899-4741
ISSN:
1509-8117
Język:
Angielski
Częstotliwość wydawania:
4 razy w roku
Dziedziny czasopisma:
Industrial Chemistry, Biotechnology, Chemical Engineering, Process Engineering