Role of substrate temperature on the growth mechanism and physical properties of spray deposited lead oxide thin films

Data publikacji: 17 paź 2014

Zakres stron: 448 - 456

DOI: https://doi.org/10.2478/s13536-014-0208-y

Słowa kluczowe

thin films, X-ray diffraction, crystal structure, energy band gap, electrical properties

© 2014 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.