Research into the relationship between the surface topography, texture and mechanical properties of PVD-Cu/Ni multilayers

Data publikacji: 09 lut 2013

Zakres stron: 101 - 107

DOI: https://doi.org/10.2478/s13536-012-0078-0

Słowa kluczowe

Cu/Ni multilayers, thermal stability, X-ray diffraction, texture, atomic force microscopy

© 2013 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.