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Gamma radiation shielding properties of (x)Bi2O3–(0.5 – x)ZnO–0.2B2O3–0.3SiO2 glass system

Bonginkosi Vincent Kheswa
Bonginkosi Vincent Kheswa
   | 23 lut 2024
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Article Category: ORIGINAL PAPER
Data publikacji: 23 lut 2024
Zakres stron: 23 - 29
Otrzymano: 22 maj 2023
Przyjęty: 20 wrz 2023
DOI: https://doi.org/10.2478/nuka-2024-0003
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© 2024 Bonginkosi Vincent Kheswa, published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Fig. 1.

Linear attenuation coefficient of glass samples S1, S2, S3, S4, and S5.
Linear attenuation coefficient of glass samples S1, S2, S3, S4, and S5.

Fig. 2.

Mass attenuation coefficient of glass samples S1, S2, S3, S4, and S5.
Mass attenuation coefficient of glass samples S1, S2, S3, S4, and S5.

Fig. 3.

Comparison of LAC from Phy-X/PSD and XCOM for S1, S2, S3, S4, and S5.
Comparison of LAC from Phy-X/PSD and XCOM for S1, S2, S3, S4, and S5.

Fig. 4.

Half-value layer of glass samples S1, S2, S3, S4, and S5.
Half-value layer of glass samples S1, S2, S3, S4, and S5.

Fig. 5.

Tenth-value layer of glass samples S1, S2, S3, S4, and S5.
Tenth-value layer of glass samples S1, S2, S3, S4, and S5.

Fig. 6.

Mean-free path of glass samples S1, S2, S3, S4, and S5.
Mean-free path of glass samples S1, S2, S3, S4, and S5.

Fig. 7.

Effective atomic number of glass samples S1, S2, S3, S4, and S5.
Effective atomic number of glass samples S1, S2, S3, S4, and S5.

Fig. 8.

Comparison of the half-value layer with literature at 0.662 MeV.
Comparison of the half-value layer with literature at 0.662 MeV.

Fig. 9.

Comparison of the half-value layer with literature at 1.332 MeV.
Comparison of the half-value layer with literature at 1.332 MeV.

Fig. 10.

Second comparison of the half-value layer with literature at 0.662 MeV.
Second comparison of the half-value layer with literature at 0.662 MeV.

he chemical contents (mol%) of glass samples used in this study [15]

Sample code Bi2O3 ZnO B2O3 SiO2 Density (g/cm3)
S1 10 40 20 30 4.59
S2 20 30 20 30 4.97
S3 30 20 20 30 5.87
S4 40 10 20 30 6.20
S5 45 5 20 30 6.31
eISSN:
1508-5791
Język:
Angielski
Częstotliwość wydawania:
4 razy w roku
Dziedziny czasopisma:
Chemistry, Nuclear Chemistry, Physics, Astronomy and Astrophysics, other
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