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Epileptic Seizure Detection using Deep Ensemble Network with Empirical Wavelet Transform


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Sreelekha Panda
Dept. Of ECE, Centurion University of Technology and ManagementIndia
Abhishek Das
Dept. Of ECE, ITER, Siksha ‘O’ Anusandhan (Deemed to be University)Bhubaneswar, India
Satyasis Mishra
Dept. Of ECE, Centurion University of Technology and ManagementIndia
Mihir Narayan Mohanty
Dept. Of ECE, ITER, Siksha ‘O’ Anusandhan (Deemed to be University)Bhubaneswar, India
eISSN:
1335-8871
Język:
Angielski
Częstotliwość wydawania:
6 razy w roku
Dziedziny czasopisma:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing