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DT-CWT Robust Filtering Algorithm for The Extraction of Reference and Waviness from 3-D Nano Scalar Surfaces


Zacytuj

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eISSN:
1335-8871
Język:
Angielski
Częstotliwość wydawania:
6 razy w roku
Dziedziny czasopisma:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing