<abstract xmlns="http://www.w3.org/1999/xhtml"><p>Copper (Cu) and nickel (Ni) nanoparticles have been grown simultaneously on glass and silicon substrates by RF sputtering method to form three Cu/Ni nanocomposites at different deposition times. The existence of Cu and Ni peaks in the X-ray diffraction (XRD) profiles confirms the crystalline structure of samples with Cu and Ni atomic content which have also been characterized by Rutherford backscattering (RBS) method. Moreover, the structural and morphological properties of the prepared nanocomposites have been compared with respect to their morphologies by means of atomic force microscopy (AFM) analysis. In order to compare the surface roughness over different spatial frequency ranges and evaluate surface quality, power spectral density (PSD) of each sample has been extracted from AFM data and also, the experimental and theoretical results have been compared. The fractal nature of these nanocomposites has been finally discussed.</p></abstract>

Copper (Cu) and nickel (Ni) nanoparticles have been grown simultaneously on glass and silicon substrates by RF sputtering method to form three Cu/Ni nanocomposites at different deposition times. The existence of Cu and Ni peaks in the X-ray diffraction (XRD) profiles confirms the crystalline structure of samples with Cu and Ni atomic content which have also been characterized by Rutherford backscattering (RBS) method. Moreover, the structural and morphological properties of the prepared nanocomposites have been compared with respect to their morphologies by means of atomic force microscopy (AFM) analysis. In order to compare the surface roughness over different spatial frequency ranges and evaluate surface quality, power spectral density (PSD) of each sample has been extracted from AFM data and also, the experimental and theoretical results have been compared. The fractal nature of these nanocomposites has been finally discussed.

Surface micromorphology analysis of Cu/Ni nanocomposite thin films by power spectra density and fractal geometry

Department of Physics, Faculty of Sciences, Science and Research Branch

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Copper (Cu) and nickel (Ni) nanoparticles have been grown simultaneously on glass and silicon substrates by RF sputtering method to form three Cu/Ni...

Surface micromorphology analysis of Cu/Ni nanocomposite thin films by power spectra density and fractal geometry

Data publikacji: 06 paź 2020

Zakres stron: 328 - 333

Otrzymano: 07 sie 2018

Przyjęty: 23 kwi 2019

DOI: https://doi.org/10.2478/msp-2020-0011

Słowa kluczowe
Cu/Ni nanocomposite, power spectral density, crystalline structure, surface micromorphology, atomic force microscopy

© 2020 Kimia Nikpasand et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Surface micromorphology analysis of Cu/Ni nanocomposite thin films by power spectra density and fractal geometry

Data publikacji: 06 paź 2020

Zakres stron: 328 - 333

Otrzymano: 07 sie 2018

Przyjęty: 23 kwi 2019

DOI: https://doi.org/10.2478/msp-2020-0011

Słowa kluczoweCu/Ni nanocomposite, power spectral density, crystalline structure, surface micromorphology, atomic force microscopy

© 2020 Kimia Nikpasand et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Słowa kluczowe
Cu/Ni nanocomposite, power spectral density, crystalline structure, surface micromorphology, atomic force microscopy