Zacytuj

Hongli Li
School of Instrument Science and Opto-electronics Engineering, Hefei University of TechnologyHefei, China
Shenzhen Engineering Laboratory of Geometry Measurement Technology, Graduate School at Shenzhen, Tsinghua UniversityShenzhen, China
Xiaohuai Chen
School of Instrument Science and Opto-electronics Engineering, Hefei University of TechnologyHefei, China
Yinbao Cheng
School of Instrument Science and Opto-electronics Engineering, Hefei University of TechnologyHefei, China
Houde Liu
Shenzhen Engineering Laboratory of Geometry Measurement Technology, Graduate School at Shenzhen, Tsinghua UniversityShenzhen, China
Hanbin Wang
Fujian Metrology Institute, Fuzhou, China
Zhenying Cheng
School of Instrument Science and Opto-electronics Engineering, Hefei University of TechnologyHefei, China
Hongtao Wang
School of Instrument Science and Opto-electronics Engineering, Hefei University of TechnologyHefei, China
eISSN:
1335-8871
Język:
Angielski
Częstotliwość wydawania:
6 razy w roku
Dziedziny czasopisma:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing