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XRD patterns of a) TiO2 - anatase thin film from low-pressure process and b) TiO2 - rutile thin film from high-energy process.
XRD patterns of a) TiO2 - anatase thin film from low-pressure process and b) TiO2 - rutile thin film from high-energy process.

Transmission characteristics (a) and refractive index (b) of TiO2 thin films with anatase and rutile structure.
Transmission characteristics (a) and refractive index (b) of TiO2 thin films with anatase and rutile structure.

Photocatalytic activity of TiO2 thin films with anatase and rutile structure based on phenol decomposition under UV-Vis light exposure.
Photocatalytic activity of TiO2 thin films with anatase and rutile structure based on phenol decomposition under UV-Vis light exposure.

Surface topography of TiO2 thin films with a) anatase and b) rutile structure.
Surface topography of TiO2 thin films with a) anatase and b) rutile structure.

Results of water contact angle and critical surface tension measurements for TiO2 thin films with a) anatase and b) rutile structure.
Results of water contact angle and critical surface tension measurements for TiO2 thin films with a) anatase and b) rutile structure.

Biological activity in dark conditions of TiO2 thin film with anatase (a, c, e) and rutile (b, d, f) structure against Eschericha coli (a, b), Staphylococcus aureus (c, d) and Candida albicans (e, f).
Biological activity in dark conditions of TiO2 thin film with anatase (a, c, e) and rutile (b, d, f) structure against Eschericha coli (a, b), Staphylococcus aureus (c, d) and Candida albicans (e, f).

Structural properties of TiO2 thin films determined based on the results of XRD.

Thin filmProcessPhaseCrystal planeD [nm]d [nm]dPDF [nm]Δd (%)PDF card
TiO2low-pressureanatase(1 0 1)19.90.35190.3520 [24]−0.0321-1272 [24]
TiO2high-energyrutile(1 1 0)4.60.32400.3247 [25]−0.2121-1276 [25]
eISSN:
2083-134X
Język:
Angielski
Częstotliwość wydawania:
4 razy w roku
Dziedziny czasopisma:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties