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Investigation of the impact of simulated solar radiation on the micro- and nanoscale morphology and mechanical properties of a sheet moulded composite surface

Andrzej Sikora

Andrzej Sikora

Electrotechnical Institute, Division of Electrotechnology and Materials ScienceWroclaw, Poland
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Sikora, Andrzej
, 
Łukasz Bednarz

Łukasz Bednarz

Electrotechnical Institute, Division of Electrotechnology and Materials ScienceWroclaw, Poland
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Bednarz, Łukasz
, 
Tomasz Fałat

Tomasz Fałat

Wroclaw University of Technology, Faculty of Microsystem Electronics and PhotonicsWroclaw, Poland
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Fałat, Tomasz
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Marek Wałecki

Marek Wałecki

Electrotechnical Institute, Division of Electrotechnology and Materials ScienceWroclaw, Poland
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Wałecki, Marek
 oraz 
Maria Adamowska

Maria Adamowska

Electrotechnical Institute, Division of Electrotechnology and Materials ScienceWroclaw, Poland
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Adamowska, Maria
  
28 wrz 2016
Investigation of the impact of simulated solar radiation on the micro- and nanoscale morphology and mechanical properties of a sheet moulded composite surface's Cover Image
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Kategoria artykułu: Research Article
Data publikacji: 28 wrz 2016
Zakres stron: 641 - 649
Otrzymano: 18 sty 2016
Przyjęty: 28 cze 2016
DOI: https://doi.org/10.1515/msp-2016-0080
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© 2016 Andrzej Sikora et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Fig. 1

Optical microscope images (left hand side), AFM topography images (middle) and the Sobel transform of AFM topography (right hand side), of the SMC A sample (top), SMC B (middle) and SMC C (bottom).
Optical microscope images (left hand side), AFM topography images (middle) and the Sobel transform of AFM topography (right hand side), of the SMC A sample (top), SMC B (middle) and SMC C (bottom).

Fig. 2

Roughness parameters of investigated samples determined using AFM topography data.
Roughness parameters of investigated samples determined using AFM topography data.

Fig. 3

Pores parameters of investigated samples determined using AFM topography data.
Pores parameters of investigated samples determined using AFM topography data.

Fig. 4

3D image of the SMC C surface acquired with optical profilometer (left hand side) and roughness parameters of investigated samples determined using optical profilometry data (right hand side).
3D image of the SMC C surface acquired with optical profilometer (left hand side) and roughness parameters of investigated samples determined using optical profilometry data (right hand side).

Fig. 5

Microcomputer tomography data acquired at the depth of 1.5 μm from the surface of the sample (left hand side) and quantitative comparison of the voids planar area, and the void breadth as well as the material volume (right hand side).
Microcomputer tomography data acquired at the depth of 1.5 μm from the surface of the sample (left hand side) and quantitative comparison of the voids planar area, and the void breadth as well as the material volume (right hand side).

Fig. 6

The Young modulus measured using force spectroscopy (left hand side) and wettability of the surface of investigated samples (right hand side).
The Young modulus measured using force spectroscopy (left hand side) and wettability of the surface of investigated samples (right hand side).

Fig. 7

Energy dissipation for the surface deformation maps. The data was acquired using NanoSwing technique. From left to right: SMC A, SMC B, SMC C. Scan area: 50 μm × 50 ×m.
Energy dissipation for the surface deformation maps. The data was acquired using NanoSwing technique. From left to right: SMC A, SMC B, SMC C. Scan area: 50 μm × 50 ×m.

Fig. 8

The distribution of energy dissipation for surface deformation. The data was acquired with NanoSwing technique.
The distribution of energy dissipation for surface deformation. The data was acquired with NanoSwing technique.

Fig. 9

An example of the nanoindentation trace and a graph showing the changes of indentation depth and projected area of the investigated samples.
An example of the nanoindentation trace and a graph showing the changes of indentation depth and projected area of the investigated samples.

Fig. 10

The advantage of the measurement of the degradation of the surface instead of whole volume of the material.
The advantage of the measurement of the degradation of the surface instead of whole volume of the material.

The ratios of selected factors obtained for presented measurement techniques showing the sensitivity of detection of SMC surface deterioration_

ParameterB/A ratioC/A ratio
Sa2.115.50
Sq2.244.53
Sz2.082.35
SP1.412.31
Atomic force microscopySdr1.648.19
Length2.552.83
Perimeter2.813.39
Z max2.895.98
Young module0.840.56
Energy dissipation22.0536.97
Sa5.2323.20
Sq5.5220.37
Optical profilometrySz2.074.03
SP1.494.50
Sdr13.8090.63
Area-1.16
Microcomputer TomographyBreadth-1.07
Material Volume-0.63
Wettability0.910.73
Impact strength-0.97
Język:
Angielski
Częstotliwość wydawania:
4 razy w roku
Dziedziny czasopisma:
Nauka o materiałach, Nauka o materiałach, inne, Nanomateriały, Funkcjonalne i inteligentne materiały, Charakterystyka i właściwości materiałów
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