<abstract xmlns="http://www.w3.org/1999/xhtml"><p> The paper deals with the security problems of scan design and investigates currently proposed solutions. A solution based on data encryption to protect the data in scan chains is discussed and problems related to the block-based encoding are outlined. Next, security extension for IEEE Std. 1149.1 providing a locking mechanism is analysed. The mechanism prevents unauthorised users to interfere via test bus with the system normal operation. Possible attack scenario is considered and the probabilities of successful attack within a given time interval are calculated for different lengths of the Lock register. The paper concludes with the description of current work focused on improvements the security of the locking mechanism, in particular by using simplified public key infrastructure.</p></abstract>

The paper deals with the security problems of scan design and investigates currently proposed solutions. A solution based on data encryption to protect the data in scan chains is discussed and problems related to the block-based encoding are outlined. Next, security extension for IEEE Std. 1149.1 providing a locking mechanism is analysed. The mechanism prevents unauthorised users to interfere via test bus with the system normal operation. Possible attack scenario is considered and the probabilities of successful attack within a given time interval are calculated for different lengths of the Lock register. The paper concludes with the description of current work focused on improvements the security of the locking mechanism, in particular by using simplified public key infrastructure.

Security Problems of Scan Design and Accompanying Measures

Jožef Stefan Institute, Jamova 39, Ljubljana, Slovenia

Journal of Electrical Engineering

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

{"article-title":"Security Problems of Scan Design and Accompanying Measures"}

The paper deals with the security problems of scan design and investigates currently proposed solutions. A solution based on data encryption to protect the...

Security Problems of Scan Design and Accompanying Measures

Data publikacji: 28 cze 2016

Zakres stron: 192 - 198

Otrzymano: 02 lip 2015

DOI: https://doi.org/10.1515/jee-2016-0027

Słowa kluczowe
test structures, boundary-scan test, security

© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Security Problems of Scan Design and Accompanying Measures

Data publikacji: 28 cze 2016

Zakres stron: 192 - 198

Otrzymano: 02 lip 2015

DOI: https://doi.org/10.1515/jee-2016-0027

Słowa kluczowetest structures, boundary-scan test, security

© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Słowa kluczowe
test structures, boundary-scan test, security