INFORMAZIONI SU QUESTO ARTICOLO

Cita

Yu. Chugui
A. Verkhogliad
Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences 41, Russkaya str., Novosibirsk, 630058, Russia
V. Bazin
Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences 41, Russkaya str., Novosibirsk, 630058, Russia
S. Kalichkin
Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences 41, Russkaya str., Novosibirsk, 630058, Russia
V. Kalikin
S. Makarov
Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences 41, Russkaya str., Novosibirsk, 630058, Russia
I. Vykhristyuk
Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences 41, Russkaya str., Novosibirsk, 630058, Russia
eISSN:
1335-8871
Lingua:
Inglese
Frequenza di pubblicazione:
6 volte all'anno
Argomenti della rivista:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing