À propos de cet article
Yu. Chugui
A. Verkhogliad
Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences 41, Russkaya str., Novosibirsk, 630058, Russia
V. Bazin
Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences 41, Russkaya str., Novosibirsk, 630058, Russia
S. Kalichkin
Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences 41, Russkaya str., Novosibirsk, 630058, Russia
V. Kalikin
S. Makarov
Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences 41, Russkaya str., Novosibirsk, 630058, Russia
I. Vykhristyuk
Technological Design Institute of Scientific Instrument Engineering, Siberian Branch of the Russian Academy of Sciences 41, Russkaya str., Novosibirsk, 630058, Russia
eISSN:
1335-8871
Langue:
Anglais
Périodicité:
6 fois par an
Sujets de la revue:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing