INFORMAZIONI SU QUESTO ARTICOLO

Cita

Baofa Hu
Pen-Tung Sah Institute of Micro-Nano Science and Technology Xiamen UniversityXiamen, China
Shenzhen Research Institute of Xiamen University, Shenzhen, China
Zhiwei Li
Pen-Tung Sah Institute of Micro-Nano Science and Technology Xiamen UniversityXiamen, China
Shenzhen Research Institute of Xiamen University, Shenzhen, China
Yuanjie Wan
School of Electronic Science and Engineering Xiamen UniversityXiamen, China
Shenzhen Research Institute of Xiamen University, Shenzhen, China
Peng Zhou
Pen-Tung Sah Institute of Micro-Nano Science and Technology Xiamen UniversityXiamen, China
Shenzhen Research Institute of Xiamen University, Shenzhen, China
Chunquan Zhang
Pen-Tung Sah Institute of Micro-Nano Science and Technology Xiamen UniversityXiamen, China
Haisheng San
Pen-Tung Sah Institute of Micro-Nano Science and Technology Xiamen UniversityXiamen, China
School of Electronic Science and Engineering Xiamen UniversityXiamen, China
Shenzhen Research Institute of Xiamen University, Shenzhen, China
eISSN:
1335-8871
Lingua:
Inglese
Frequenza di pubblicazione:
6 volte all'anno
Argomenti della rivista:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing