Dielectric Resonators for the Measurements of the Surface Impedance of Superconducting Films
, e
17 giu 2014
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Pubblicato online: 17 giu 2014
Pagine: 164 - 170
Ricevuto: 25 lug 2013
Accettato: 20 mag 2014
DOI: https://doi.org/10.2478/msr-2014-0022
Parole chiave
© by E. Silva
This article is distributed under the terms of the Creative Commons Attribution Non-Commercial License, which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
We present the development, realization and setup of dielectric resonators, for the purpose of measuring the surface impedance at microwave frequencies of superconducting thin films. We focus on resonators designed to operate in dc magnetic fields, optimized for the measurements of the variation of the surface impedance with the applied field. Two resonators, operating at 8 and 48 GHz, are presented. We discuss different approaches to the measurement of the resonator parameters, with particular attention to the nonidealities of real setups in a cryogenic environment. Finally, we present some sample measurement of high-Tc and low-Tc superconducting films.