Dielectric Resonators for the Measurements of the Surface Impedance of Superconducting Films
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17. Juni 2014
Über diesen Artikel
Online veröffentlicht: 17. Juni 2014
Seitenbereich: 164 - 170
Eingereicht: 25. Juli 2013
Akzeptiert: 20. Mai 2014
DOI: https://doi.org/10.2478/msr-2014-0022
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© by E. Silva
This article is distributed under the terms of the Creative Commons Attribution Non-Commercial License, which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
We present the development, realization and setup of dielectric resonators, for the purpose of measuring the surface impedance at microwave frequencies of superconducting thin films. We focus on resonators designed to operate in dc magnetic fields, optimized for the measurements of the variation of the surface impedance with the applied field. Two resonators, operating at 8 and 48 GHz, are presented. We discuss different approaches to the measurement of the resonator parameters, with particular attention to the nonidealities of real setups in a cryogenic environment. Finally, we present some sample measurement of high-Tc and low-Tc superconducting films.