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Fig. 1

The energy band gap of Al2Se3 at varied (A) time of deposition and (B) cathodic potential.
The energy band gap of Al2Se3 at varied (A) time of deposition and (B) cathodic potential.

Fig. 2

Absorption spectra as a function of wavelength at varied (A) time and (B) voltage (B).
Absorption spectra as a function of wavelength at varied (A) time and (B) voltage (B).

Fig. 3

Percentage of transmittance of Al2Se3 as a function of wavelength at varied (A) time and (B) voltage.
Percentage of transmittance of Al2Se3 as a function of wavelength at varied (A) time and (B) voltage.

Fig. 4

Reflection spectra as a function of wavelength at varied (A) time and (B) voltage.
Reflection spectra as a function of wavelength at varied (A) time and (B) voltage.

Fig. 5

Absorption coefficient as a function of wavelength at varied (A) time and (B) voltage.
Absorption coefficient as a function of wavelength at varied (A) time and (B) voltage.

Fig. 6

Extinction coefficient as a function of wavelength at varied (A) time and (B) voltage.
Extinction coefficient as a function of wavelength at varied (A) time and (B) voltage.

Fig. 7

PEC signal as a function of growth voltage for glass/FTO/Al2Se3 layers at varied (A) time and (B) voltage. FTO, fluorine-doped tin oxide; PEC, photoelectrochemical cells.
PEC signal as a function of growth voltage for glass/FTO/Al2Se3 layers at varied (A) time and (B) voltage. FTO, fluorine-doped tin oxide; PEC, photoelectrochemical cells.

Film thickness values with the variation in the time of deposition and cathodic potential.

Film thickness as the time of deposition increases Film thickness as the cathodic potential increases

Time (min) Thickness (nm) Cathodic potential (mV) Thickness (nm)
3 193 1,000 234
6 233 1,100 344
9 399 1,200 522
12 476 1,300 714
15 592 1,400 773

Measured material properties as a function of deposition time and cathodic potential based on UV and PEC results.

Semiconductor type and energy band gaps

As time of deposition increases As voltage increases

Time (min) Type Eg (eV) Cathodic potential (mV) Type Eg (eV)
3 N 3.30 1,000 P 3.23
6 N 3.19 1,100 I-Intrinsic 3.20
9 N 2.83 1,200 N 3.00
12 N 2.79 1,300 N 2.96
15 N 2.70 1,400 N 2.95
eISSN:
2083-134X
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties