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Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PC61BM nanocomposite surface deterioration

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02 nov 2018
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Sikora, Andrzej
Electrotechnical Institute, Division of Electrotechnology and Materials ScienceWrocław, Poland
Moczała, Magdalena
Electrotechnical Institute, Division of Electrotechnology and Materials ScienceWrocław, Poland
Boharewicz, Bartosz
Electrotechnical Institute, Division of Electrotechnology and Materials ScienceWrocław, Poland