INFORMAZIONI SU QUESTO ARTICOLO

Cita

Bartłomiej Dec
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Mateusz Ficek
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Michał Rycewicz
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Łukasz Macewicz
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Marcin Gnyba
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Mirosław Sawczak
Polish Academy of Sciences, The Szewalski Institute of Fluid-Flow Machinery,Gdansk, Poland
Michał Sobaszek
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Robert Bogdanowicz
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
eISSN:
2083-134X
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties