Cite

Bartłomiej Dec
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Mateusz Ficek
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Michał Rycewicz
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Łukasz Macewicz
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Marcin Gnyba
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Mirosław Sawczak
Polish Academy of Sciences, The Szewalski Institute of Fluid-Flow Machinery,Gdansk, Poland
Michał Sobaszek
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
Robert Bogdanowicz
Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk, University of Technology,Gdansk, Poland
eISSN:
2083-134X
Idioma:
Inglés
Calendario de la edición:
4 veces al año
Temas de la revista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties