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Journal of Electrical Engineering
Volume 65 (2014): Numero 5 (September 2014)
Accesso libero
Structural Characterization of Doped Thick Gainnas Layers - Ambiguities and Challenges
Damian Pucicki
Damian Pucicki
,
Katarzyna Bielak
Katarzyna Bielak
,
Beata Ściana
Beata Ściana
,
Wojciech Dawidowski
Wojciech Dawidowski
,
Karolina Żelazna
Karolina Żelazna
,
Jarosław Serafińczuk
Jarosław Serafińczuk
,
Jaroslav Kováč
Jaroslav Kováč
,
Andrej Vincze
Andrej Vincze
,
Łukasz Gelczuk
Łukasz Gelczuk
e
Piotr Dłużewski
Piotr Dłużewski
| 05 nov 2014
Journal of Electrical Engineering
Volume 65 (2014): Numero 5 (September 2014)
INFORMAZIONI SU QUESTO ARTICOLO
Articolo precedente
Articolo Successivo
Sommario
Bibliografia
Autori
Articoli in questo Numero
Anteprima
PDF
Cita
CONDIVIDI
Pubblicato online:
05 nov 2014
Pagine:
299 - 303
Ricevuto:
15 giu 2014
DOI:
https://doi.org/10.2478/jee-2014-0048
Parole chiave
dilute nitrides
,
GaInNAs
,
composition determination
,
HRXRD
© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Damian Pucicki
Faculty of Microsystem Electronics and Photonics, Wroc law University of Technology, Z. Janiszewskiego 11/17, 50-372, Wroc law, Poland
Katarzyna Bielak
Faculty of Microsystem Electronics and Photonics, Wroc law University of Technology, Z. Janiszewskiego 11/17, 50-372, Wroc law, Poland
Beata Ściana
Faculty of Microsystem Electronics and Photonics, Wroc law University of Technology, Z. Janiszewskiego 11/17, 50-372, Wroc law, Poland
Wojciech Dawidowski
Faculty of Microsystem Electronics and Photonics, Wroc law University of Technology, Z. Janiszewskiego 11/17, 50-372, Wroc law, Poland
Karolina Żelazna
Institute of Physics, Wroc law University of Technology, Wyb. Wyspia´nskiego 27, 50-370, Wroclaw, Poland
Jarosław Serafińczuk
Faculty of Microsystem Electronics and Photonics, Wroc law University of Technology, Z. Janiszewskiego 11/17, 50-372, Wroclaw, Poland
Jaroslav Kováč
Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Ilkovičova 3, 812 19 Bratislava, Slovakia
Andrej Vincze
International Laser Centre, Ilkovičova 3, 841 04 Bratislava, Slovakia
Łukasz Gelczuk
Faculty of Microsystem Electronics and Photonics, Wroc law University of Technology, Z. Janiszewskiego 11/17, 50-372, Wroc law, Poland
Piotr Dłużewski
Institute of Physics, Polish Academy of Science, Al. Lotników 32/46, 02-668 Warsaw, Poland