A MLMVN with Arbitrary Complex-Valued Inputs and a Hybrid Testability Approach for the Extraction of Lumped Models Using FRA

Pubblicato online: 20 ago 2018

Pagine: 5 - 19

Ricevuto: 28 mag 2017

Accettato: 19 ott 2017

DOI: https://doi.org/10.2478/jaiscr-2018-0021

Parole chiave

Analog circuits, Complex-valued neural networks, Lumped models, Testability

© 2019 Igor Aizenberg et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.