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The Fast Method for Correction of Distortion on Infrared Marker-Based Tracking System

Haibin Wang

Haibin Wang

  • Institute Microelectronics of Chinese Academy of SciencesChina
  • Guangzhou Institutes of Advanced Technology, Chinese Academy of SciencesChina
  • Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology, Shenzhen Institutes of Advanced Technology, ShenzhenChina
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Wang, Haibin
, 
Qing He

Qing He

  • Guangzhou Institutes of Advanced Technology, Chinese Academy of SciencesChina
  • Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology, Shenzhen Institutes of Advanced Technology, ShenzhenChina
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He, Qing
, 
Guan Guan

Guan Guan

  • Guangzhou Institutes of Advanced Technology, Chinese Academy of SciencesChina
  • Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology, Shenzhen Institutes of Advanced Technology, ShenzhenChina
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Guan, Guan
, 
Bin Leng

Bin Leng

  • Guangzhou Institutes of Advanced Technology, Chinese Academy of SciencesChina
  • Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology, Shenzhen Institutes of Advanced Technology, ShenzhenChina
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Leng, Bin
 e 
Dewen Zeng

Dewen Zeng

  • Guangzhou Institutes of Advanced Technology, Chinese Academy of SciencesChina
  • Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology, Shenzhen Institutes of Advanced Technology, ShenzhenChina
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Zeng, Dewen
  
20 feb 2013
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Pubblicato online: 20 feb 2013
Pagine: 259 - 277
Ricevuto: 19 set 2012
Accettato: 26 dic 2012
DOI: https://doi.org/10.21307/ijssis-2017-539
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© 2013 Haibin Wang et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Lingua:
Inglese
Frequenza di pubblicazione:
1 volte all'anno
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