Accesso libero

Optical Probe Current Sensor Module Using the Kerr Effect of Exchange-Coupled Magnetic Film and its Application to Igbt Switching Current Measurements

INFORMAZIONI SU QUESTO ARTICOLO

Cita

K. Ogawa
Spin Device Technology Center Shinshu University NaganoNagano, Japan
S. Suzuki
Spin Device Technology Center Shinshu University NaganoNagano, Japan
M. Sonehara
Spin Device Technology Center Shinshu University NaganoNagano, Japan
T. Sato
Spin Device Technology Center Shinshu University NaganoNagano, Japan
K. Asanuma
Department of Production Engineering Nagano Prefectural Institute of Technology UedaNagano, Japan
eISSN:
1178-5608
Lingua:
Inglese
Frequenza di pubblicazione:
Volume Open
Argomenti della rivista:
Engineering, Introductions and Overviews, other